Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

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A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Design and performance of a scanning transmission x-ray microscope ~STXM! at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials. © 1998 America...

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ژورنال

عنوان ژورنال: Journal of Synchrotron Radiation

سال: 1998

ISSN: 0909-0495

DOI: 10.1107/s0909049597014283